The Open Electrical & Electronic Engineering Journal


ISSN: 1874-1290 ― Volume 10, 2016


Comparison of Neural Networks and Logistic Regression in Assessing the Occurrence of Failures in Steel Structures of Transmission Lines
The Open Electrical & Electronic Engineering Journal, 2016, 10: 11-26
A.C.G Bissacot, S.A.B Salgado, P.P Balestrassi, A.P Paiva, A.C Zambroni Souza, R. Wazen

[Electronic publication date: 17/ 3/ 2016 ] [Collection year: 2016 ]
[Publisher Id: TOEEJ-10-11] [DOI: 10.2174/1874129001610010011]

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A Novel Controllable BIST Circuit for embedded SRAM
The Open Electrical & Electronic Engineering Journal, 2016, 10: 1-10
Zhiting Lin, Chunyu Peng, Kun Wang

[Electronic publication date: 29/ 01/ 2016 ] [Collection year: 2016 ]
[Publisher Id: TOEEJ-10-1] [DOI: 10.2174/1874129001610010001]

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