Fig. (20) Change of normal incidence reflectance at λ=600 nm for W recrystallized (squares) and ITER-grade (solid circles) A.L.M.T. Corp. specimens not irradiated (lines) and irradiated with 20 MeV W+6 ions to 3 dpa (symbols) on the depth of the layer sputtered by 600 eV Ar ions.